A team from the School of Computer Science and Technology at the Beijing Institute of Technology (BIT), led by professors Liu Chi and Gao Guangyu, won a gold medal at the recent Concours Lépine, an annual invention fair and competition held in Paris, France.

This innovation fair attracted over 200 innovative projects from 15 countries and regions.

Professor Liu Chi's team has previously secured gold medals at the 77th Internationale Erfindermesse Nürnberg, the 26th Bangkok International Intellectual Property, Invention, Innovation and Technology Exposition, and the 51st Geneva International Exhibition of Inventions, and now at the 125th Concours Lépine in Paris.

The award-winning project, "Self-evolving Intelligent Quality Inspection Method and System for Key Industrial Components", addresses challenges in the manufacturing and maintenance of industrial components, such as the scarcity of defect samples, dynamic changes in defect types, and complex inspection rules.

The project introduces three core technologies: few-shot limited supervision recognition, continuous self-evolution learning, and multi-modal logical defect recognition.

These innovations significantly enhance the flexibility, functionality, and interpretability of AI inspection systems in complex industrial scenarios, offering an intelligent solution for the quality management of key industrial components with significant application value.

The Concours Lépine, founded in 1901, is organized annually by the French Federation of Inventors. As of 2026, it has been held 125 times and attracts over 500,000 visitors each year. It is considered one of the "world's five major international invention exhibitions".